Title: |
Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits |
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Authors: |
Mengshuo Wang |
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Fudan University, Microelectronics Department, State Key Lab of ASIC & System
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Fan Yang |
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Fudan University, Microelectronics Department, State Key Lab of ASIC & System
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Changhao Yan |
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Fudan University, Microelectronics Department, State Key Lab of ASIC & System
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Xuan Zeng |
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Fudan University, Microelectronics Department, State Key Lab of ASIC & System
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Xiangdong Hu |
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Shanghai High Performance Integrated Circuit Design Center
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Sharing: |
Unknown
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Verification: |
Authors have
not verified
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Artifact Evaluation Badge: |
none
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NSF Award Numbers: |
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DBLP Key: |
conf/dac/WangYYZH17
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Author Comments: |
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