Design Automation Conference, DAC 2017


Article Details
Title: Stress-Aware Loops Mapping on CGRAs with Considering NBTI Aging Effect
Article URLs:
Alternative Article URLs:
Authors: Jiangyuan Gu
  • Tsinghua University, Institute of Microelectronics
  • Tsinghua National Laboratory for Information Science and Technology (TNList)
Shouyi Yin
  • Tsinghua University, Institute of Microelectronics
  • Tsinghua National Laboratory for Information Science and Technology (TNList)
Shaojun Wei
  • Tsinghua University, Institute of Microelectronics
  • Tsinghua National Laboratory for Information Science and Technology (TNList)
Sharing: Unknown
Verification: Authors have not verified information
Artifact Evaluation Badge: none
Artifact URLs:
Artifact Correspondence Email Addresses:
NSF Award Numbers:
DBLP Key: conf/dac/GuYW17
Author Comments:

Discuss this paper and its artifacts below