ACM Computer and Communications Security, CCS 2016


Article Details
Title: Scalable Graph-based Bug Search for Firmware Images
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Authors: Qian Feng
  • Syracuse University, Department of EECS
Rundong Zhou
  • Syracuse University, Department of EECS
Chengcheng Xu
  • Syracuse University, Department of EECS
Yao Cheng
  • Syracuse University, Department of EECS
Brian Testa
  • Syracuse University, Department of EECS
  • Air Force Research Lab
Heng Yin
  • Syracuse University, Department of EECS
  • University of California, Riverside
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NSF Award Numbers: 1054605
DBLP Key: conf/ccs/FengZXCTY16
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